Electron Microscopy and Analysis - Peter J. Goodhew - Books - Taylor & Francis Ltd - 9780748409686 - November 30, 2000
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Peter J. Goodhew
Electron Microscopy and Analysis 3rd edition

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A guide to scanning and transmission microscopes and to the analytical techniques based on them. It covers the techniques of electron energy loss spectroscopy and energy dispersive X-ray analysis. It compares electron microscopic techniques to many of the competing physical investigative techniques available.

254 pages, 147 colour illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 30, 2000
ISBN13 9780748409686
Publishers Taylor & Francis Ltd
Pages 264
Dimensions 236 × 157 × 16 mm   ·   420 g
Language English  

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