Tell your friends about this item:
Statistical Methods for Materials Science: The Data Science of Microstructure Characterization Simmons, Jeffrey P. (Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio, USA) 1st edition
Price
R 1,363
excl. VAT
Ordered from remote warehouse
Expected to be ready for shipping Nov 5 - 17
Christmas presents can be returned until 31 January
Get notified about new Simmons, Jeffrey P. (Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio, USA) releases
Add to your iMusic wish list
Statistical Methods for Materials Science: The Data Science of Microstructure Characterization
Simmons, Jeffrey P. (Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio, USA)
This book provides the practical tools and fundamentals needed for researchers in materials science to understand how to analyze large datasets using statistical methods, especially inverse methods applied to microstructure characterization. It contains valuable guidance on essential topics such as denoising and data modeling.
514 pages
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | March 31, 2021 |
| ISBN13 | 9780367780289 |
| Publishers | Taylor & Francis Ltd |
| Pages | 514 |
| Dimensions | 150 × 220 × 10 mm · 453 g |
| Language | English |
| Editor | Bouman, Charles A. |
| Editor | De Graef, Marc |
| Editor | Drummy, Lawrence F. |
| Editor | Simmons, Jeffrey P. |