Tell your friends about this item:
Metrology, Inspection and Process Control for Microlithography XVII (Proceedings of SPIE) Herr
Do you have a profile? Log in
Christmas presents can be returned until 31 January
Get notified about new Herr releases
Our customers say:
Add to your iMusic wish list
Metrology, Inspection and Process Control for Microlithography XVII (Proceedings of SPIE)
Herr
1296 pages
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | June 30, 2003 |
| ISBN13 | 9780819448439 |
| Publishers | SPIE Press |
| Pages | 1296 |
| Dimensions | 150 × 220 × 10 mm · 2.14 kg (Weight (estimated)) |
![Cover for Barbara G. Grant · Getting Started with UAV Imaging Systems: A Radiometric Guide - Press Monographs (Paperback Book) [Second edition] (2026)](https://imusic-static.b-cdn.net/images/missing-tall.png)
![Cover for Hong Xiao · Introduction to Semiconductor Manufacturing Technology - Press Monographs (Paperback Book) [Second edition] (2012)](https://imusic.b-cdn.net/images/item/original/530/9781510616530.jpg?hong-xiao-2012-introduction-to-semiconductor-manufacturing-technology-press-monographs-paperback-book&class=scaled&v=1694198546)
![Cover for Michael A. Mueller · Introduction to Confocal Fluorescence Microscopy - Tutorial Texts (Paperback Book) [Second edition] (2005)](https://imusic.b-cdn.net/images/item/original/431/9780819460431.jpg?michael-a-mueller-2005-introduction-to-confocal-fluorescence-microscopy-tutorial-texts-paperback-book&class=scaled&v=1692768712)