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Process and Materials Characterization and Diagnostics in IC Manufacturing: II (Proceedings of SPIE) Tobin
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Process and Materials Characterization and Diagnostics in IC Manufacturing: II (Proceedings of SPIE)
Tobin
222 pages
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | July 31, 2003 |
| ISBN13 | 9780819448460 |
| Publishers | SPIE Press |
| Pages | 222 |
| Dimensions | 150 × 220 × 10 mm · 493 g (Weight (estimated)) |
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