MOS Interface Physics, Process and Characterization - Shengkai Wang - Books - Taylor & Francis Ltd - 9781032106281 - January 29, 2024
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Shengkai Wang
MOS Interface Physics, Process and Characterization

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The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.

162 pages, 1 Tables, black and white; 97 Line drawings, black and white; 26 Halftones, black and whi

Media Books     Paperback Book   (Book with soft cover and glued back)
Released January 29, 2024
ISBN13 9781032106281
Publishers Taylor & Francis Ltd
Pages 162
Dimensions 150 × 220 × 10 mm   ·   453 g
Language English  

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