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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics — 2004 - MRS Proceedings
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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics — 2004 - MRS Proceedings
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
422 pages, black & white illustrations
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | June 5, 2014 |
| ISBN13 | 9781107409224 |
| Publishers | Cambridge University Press |
| Pages | 422 |
| Dimensions | 152 × 229 × 22 mm · 668 g (Weight (estimated)) |
| Language | English |
| Editor | Carter, R. J. |
| Editor | Hau-Riege, C. S. |
| Editor | Kloster, G. m. |
| Editor | Lu, T. -M. (Rensselaer Polytechnic Institute, New York) |
| Editor | Schulz, S. E. |
