Tell your friends about this item:
Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics: Volume 612 - MRS Proceedings
Price
R 778
excl. VAT
Ordered from remote warehouse
Expected to be ready for shipping Nov 10 - 20
Christmas presents can be returned until 31 January
Our customers say:
Add to your iMusic wish list
Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics: Volume 612 - MRS Proceedings
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
614 pages, black & white illustrations
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | June 5, 2014 |
| ISBN13 | 9781107413153 |
| Publishers | Cambridge University Press |
| Pages | 614 |
| Dimensions | 152 × 229 × 32 mm · 969 g (Weight (estimated)) |
| Language | English |
| Editor | Joo, Y. -C. (Seoul National University) |
| Editor | Maex, K. |
| Editor | Oehrlein, G. S. (University of Maryland, College Park) |
| Editor | Ogawa, S. |
| Editor | Wetzel, J. T. |
