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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems - IEEE Press Eishi H. Ibe 1st edition
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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems - IEEE Press
Eishi H. Ibe
This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions.
296 pages
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | February 13, 2015 |
| ISBN13 | 9781118479292 |
| Publishers | John Wiley & Sons Inc |
| Pages | 296 |
| Dimensions | 175 × 249 × 20 mm · 599 g |
| Language | English |
