Next Generation HALT and HASS: Robust Design of Electronics and Systems - Quality and Reliability Engineering Series - Kirk A. Gray - Books - John Wiley & Sons Inc - 9781118700235 - May 23, 2016
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Kirk A. Gray
Next Generation HALT and HASS: Robust Design of Electronics and Systems - Quality and Reliability Engineering Series 1st edition

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Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks.

300 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
Released May 23, 2016
ISBN13 9781118700235
Publishers John Wiley & Sons Inc
Pages 296
Dimensions 236 × 161 × 19 mm   ·   498 g
Language English  

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