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ISTFA 2014, Proceedings from the 40th International Symposium for Testing and Failure Analysis ASM International
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ISTFA 2014, Proceedings from the 40th International Symposium for Testing and Failure Analysis
ASM International
Features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, "Exploring the Many Facets of Failure Analysis".
500 pages
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | April 30, 2015 |
| ISBN13 | 9781627080743 |
| Publishers | A S M International |
| Pages | 500 |
| Dimensions | 150 × 220 × 10 mm · 749 g (Weight (estimated)) |
