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Nanometer-scale Defect Detection Using Polarized Light Dahoo, Pierre-Richard (University of Versailles Saint-Quentin, France)
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Nanometer-scale Defect Detection Using Polarized Light
Dahoo, Pierre-Richard (University of Versailles Saint-Quentin, France)
This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
316 pages, black & white illustrations
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | August 12, 2016 |
| ISBN13 | 9781848219366 |
| Publishers | ISTE Ltd and John Wiley & Sons Inc |
| Pages | 320 |
| Dimensions | 165 × 241 × 23 mm · 612 g |
