Electrical Atomic Force Microscopy for Nanoelectronics - - Books - Springer Nature Switzerland AG - 9783030156114 - August 24, 2019
In case cover and title do not match, the title is correct

Electrical Atomic Force Microscopy for Nanoelectronics 1st ed. 2019 edition

Price
R 3,138
excl. VAT

Ordered from remote warehouse

Expected to be ready for shipping Jun 2 - 8

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development.

408 pages, 60 Tables, color; 230 Illustrations, color; 26 Illustrations, black and white; XX, 408 p.

Media Books     Book
Released August 24, 2019
ISBN13 9783030156114
Publishers Springer Nature Switzerland AG
Pages 408
Dimensions 150 × 220 × 20 mm   ·   805 g
Language German  
Editor Celano, Umberto