Multi-run Memory Tests for Pattern Sensitive Faults - Ireneusz Mrozek - Books - Springer International Publishing AG - 9783319912035 - July 18, 2018
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Ireneusz Mrozek
Multi-run Memory Tests for Pattern Sensitive Faults 1st ed. 2019 edition

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This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.

135 pages, 50 Tables, color; 34 Illustrations, black and white; X, 135 p. 34 illus.

Media Books     Hardcover Book   (Book with hard spine and cover)
Released July 18, 2018
ISBN13 9783319912035
Publishers Springer International Publishing AG
Pages 135
Dimensions 150 × 220 × 20 mm   ·   454 g
Language French  

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