Applied Scanning Probe Methods IX: Characterization - NanoScience and Technology - - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642093418 - November 30, 2010
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Applied Scanning Probe Methods IX: Characterization - NanoScience and Technology Softcover reprint of hardcover 1st ed. 2008 edition

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The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely and comprehensive overview of SPM applications.

446 pages, 25 black & white tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 30, 2010
ISBN13 9783642093418
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 387
Dimensions 155 × 235 × 23 mm   ·   674 g
Language German  
Editor Bhushan, Bharat
Editor Fuchs, Harald
Editor Tomitori, Masahiko

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