X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 - Springer Series in Optical Sciences - David Sayre - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783662144909 - October 3, 2013
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X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 - Springer Series in Optical Sciences Softcover reprint of the original 1st ed. 1988 Edition

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This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987.


455 pages, 286 black & white illustrations, 2 colour illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 3, 2013
ISBN13 9783662144909
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 455
Dimensions 152 × 229 × 24 mm   ·   625 g
Language German  
Editor Howells, Malcolm
Editor Kirz, Janos
Editor Rarback, Harvey
Editor Sayre, David

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